بلاگ کا جائزہ: 28 فروری

Synopsys' ایمیلی ویاسنوف suggests that employing virtual sensors when developing an autonomous driving system helps aid in sensor design and minimizes the hazards associated with extensive real-world driving.

Cadence کی Anthony Ducimo introduces a methodology for embedded BootROM verification that relies only on standard RTL verification toolchains to reveal bugs, identify unused sections of the BootROM code, and expose untested features.

سیمنز سٹیفن شاویز argues for the importance of design for manufacturability in the PCB design process and finds that adhering to IPC guidelines, including external stakeholders, and shifting DFM analysis left helps streamline production and mitigate errors.

کیزائٹ کی ایملی یان considers the impact wide bandgap semiconductors will have on power electronics trends in 2024 and how they could redefining the design and simulation workflows for the next decade.

Ansys' Pavani Gottipati and Jingchen Liang find that the increasing demand to charge electronic devices faster means thermal management is necessary to protect wireless chargers from overheating problems and point to some of the unique thermal challenges.

بازو کی Richard Grisenthwaite points out two initiatives the company is taking in furtherance of a common framework for chiplet partitioning and interface standardization.

Renesas' کارلوس روڈریگ notes that despite the temptation to choose the biggest, most powerful 32-bit or 64-bit MCU available, in many cases a less powerful, lower-bit-count MCU is a better fit for the job.

SEMI کی Margaret Kindling chats with Antoinette Hamilton of Lam Research about the semiconductor industry’s progress towards diversity, why inclusion is critical to everyone’s success, and how companies and leadership can effect greater change.

اس کے علاوہ، تازہ ترین میں نمایاں کردہ بلاگز کو چیک کریں۔ مینوفیکچرنگ، پیکجنگ اور مواد نیوز لیٹر:

چیف ایڈیٹر ایڈ اسپرلنگ digs into Intel’s foundry push and why it’s starting to win converts.

لیم ریسرچ جیمز کم shows how a biased deposition or etch process can create structural defects in different radial directions, leading to performance variability.

Synopsys' وویک جین argues that the data generated in a fab needs to be analyzed and acted on quickly to ensure tight process control, high yield, and avoid process excursions.

SEMI کی Mark da Silva, Nishita Rao, and Karim Somani call for the industry to collaborate in developing a common understanding of digital twin technology across various hierarchical levels.